Long term reliability test
Posted: 06 October 2008, 18:02 PM
After getting distracted for the past few months, I've returned to a ZBasic project that has been running on the bench for quite a while now. As a testament to the ZBasic platform, and the underlying Atmel hardware, the project has been running for a little over 5000 hours (214 days to be precise) continuously. This number is only as accurate as the ZX-24n clock source, though, so this isn't a scientifically accurate test, but it does go to show how well these devices can hold up.
One of the reasons for this test was to verify that the circular buffer used to keep track of the total running time would perform it's job of wear leveling the EEPROM properly. I have yet to see a single error. Mathematically, the EEPROM should last over 300,000 hours.
-Don
One of the reasons for this test was to verify that the circular buffer used to keep track of the total running time would perform it's job of wear leveling the EEPROM properly. I have yet to see a single error. Mathematically, the EEPROM should last over 300,000 hours.
-Don